Title :
Spurious Ionization From Noise in Kinetic Particle Simulations
Author :
Albright, Brian J. ; Bowers, Kevin J.
Author_Institution :
Appl. Phys. Div., Los Alamos Nat. Lab., NM
Abstract :
The inclusion of field ionization models in kinetic plasma simulations is desired in several applications. The ionization rates in these models are sensitive to noise in the electric field; however, and in some cases, spurious "numerical" ionization may dominate the physical ionization. In this paper, analytic ionization rates are obtained as a function of the noise spectrum of the electric field. These expressions have applicability to several settings, including colored noise, as are obtained from digital filters. As such, they provide a means for quantitatively assessing the efficacy of candidate noise mitigation schemes, such as increasing the computational particle number, temporally averaging the electric field, or applying more sophisticated digital filtering techniques
Keywords :
field ionisation; plasma kinetic theory; plasma simulation; computational particle number; digital filters; kinetic particle simulations; noise spectrum; spurious ionization; Background noise; Computational modeling; Digital filters; Ion beams; Ionization; Kinetic theory; Laboratories; Laser modes; Laser noise; Plasma simulation; Ionization; level-crossing statistics; particle-in-cell simulation; short-pulse lasers;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2006.876487