• DocumentCode
    1123606
  • Title

    Spurious Ionization From Noise in Kinetic Particle Simulations

  • Author

    Albright, Brian J. ; Bowers, Kevin J.

  • Author_Institution
    Appl. Phys. Div., Los Alamos Nat. Lab., NM
  • Volume
    34
  • Issue
    4
  • fYear
    2006
  • Firstpage
    1503
  • Lastpage
    1507
  • Abstract
    The inclusion of field ionization models in kinetic plasma simulations is desired in several applications. The ionization rates in these models are sensitive to noise in the electric field; however, and in some cases, spurious "numerical" ionization may dominate the physical ionization. In this paper, analytic ionization rates are obtained as a function of the noise spectrum of the electric field. These expressions have applicability to several settings, including colored noise, as are obtained from digital filters. As such, they provide a means for quantitatively assessing the efficacy of candidate noise mitigation schemes, such as increasing the computational particle number, temporally averaging the electric field, or applying more sophisticated digital filtering techniques
  • Keywords
    field ionisation; plasma kinetic theory; plasma simulation; computational particle number; digital filters; kinetic particle simulations; noise spectrum; spurious ionization; Background noise; Computational modeling; Digital filters; Ion beams; Ionization; Kinetic theory; Laboratories; Laser modes; Laser noise; Plasma simulation; Ionization; level-crossing statistics; particle-in-cell simulation; short-pulse lasers;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2006.876487
  • Filename
    1673562