Title :
A Perceptually Inspired Variational Framework for Color Enhancement
Author :
Palma-Amestoy, Rodrigo ; Provenzi, Edoardo ; Bertalmio, Marcelo ; Caselles, Vincent
Author_Institution :
Univ. de Chile, Santiago
fDate :
3/1/2009 12:00:00 AM
Abstract :
Basic phenomenology of human color vision has been widely taken as an inspiration to devise explicit color correction algorithms. The behavior of these models in terms of significative image features (such as, e.g., contrast and dispersion) can be difficult to characterize. To cope with this, we propose to use a variational formulation of color contrast enhancement that is inspired by the basic phenomenology of color perception. In particular, we devise a set of basic requirements to be fulfilled by an energy to be considered as ´perceptually inspired´, showing that there is an explicit class of functionals satisfying all of them. We single out three explicit functionals that we consider of basic interest, showing similarities and differences with existing models. The minima of such functionals is computed using a gradient descent approach. We also present a general methodology to reduce the computational cost of the algorithms under analysis from O(N2) to O(N logN), being N the number of pixels of the input image.
Keywords :
computational complexity; feature extraction; gradient methods; image colour analysis; image enhancement; variational techniques; visual perception; color contrast enhancement; color correction algorithm; color perceptually inspired variational framework; computational complexity; gradient descent approach; human color vision; image feature extraction; Color; Constrained optimization; Enhancement; Filtering; Gradient methods; Iterative solution techniques; Partial Differential Equations; Algorithms; Artificial Intelligence; Biomimetics; Color; Color Perception; Colorimetry; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2008.86