Title :
Wireless System for Microwave Test Signal Generation
Author :
Yin, Qizhang ; Eisenstadt, William R. ; Xia, Tian
Author_Institution :
Monolithic Power Syst., San Jose
Abstract :
RF testing involves distribution of an RF source to chips. This article describes an RF embedded-testing technique that distributes RF sources to the unpackaged RF chip via an antenna. The authors demonstrate this technique on a 5-GHz low-noise amplifier, thus eliminating expensive RF probes and test fixtures.
Keywords :
low noise amplifiers; microwave amplifiers; microwave antennas; microwave generation; radiocommunication; signal generators; RF chip; RF embedded-testing technique; RF probes; frequency 5 GHz; low-noise amplifier; microwave test signal generation; wireless system; Circuit testing; Dipole antennas; Microwave antennas; Microwave circuits; Microwave generation; Power generation; RF signals; Radio frequency; Signal generators; System testing; LNA test; RF BIST; RF IC; embedded test; microwave test; wireless test;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2008.57
