• DocumentCode
    1123971
  • Title

    Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

  • Author

    Chang, M.-F. ; Wen, K.A. ; Chiou, L.Y.

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    41
  • Issue
    15
  • fYear
    2005
  • fDate
    7/21/2005 12:00:00 AM
  • Firstpage
    834
  • Lastpage
    835
  • Abstract
    A dynamic bitline shielding (DBS) technique is proposed for high-speed via-programming ROMs, to eliminate code-pattern-dependent crosstalk-induced read failure (CIRF) and increase code-pattern coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.
  • Keywords
    crosstalk; embedded systems; read-only storage; shielding; 256 kbyte; code pattern insensitive; crosstalk induced read failure; dynamic bitline shielding; embedded ROM; high speed via programming; sensing margin;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20051738
  • Filename
    1487734
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1123971