DocumentCode :
1123979
Title :
Discussing DRAM and CMOS Scaling with Inventor Bob Dennard
Volume :
25
Issue :
2
fYear :
2008
Firstpage :
188
Lastpage :
191
Abstract :
This is one of a series of ongoing interviews in IEEE Design & Test with well-known engineers in the electronics industry. In this interview, Ken Wagner talks with IBM Fellow Bob Dennard, the inventor of DRAM. In addition to his foundational work in DRAM, Dennard is also well-known for his work in CMOS process scaling.
Keywords :
CMOS process; CMOS technology; Design engineering; Educational institutions; Electronic equipment testing; Engineering profession; History; Integrated circuit technology; Medals; Random access memory; Bob Dennard; CMOS process scaling; IBM Fellow; inventor of DRAM;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.35
Filename :
4483822
Link To Document :
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