• DocumentCode
    1123979
  • Title

    Discussing DRAM and CMOS Scaling with Inventor Bob Dennard

  • Volume
    25
  • Issue
    2
  • fYear
    2008
  • Firstpage
    188
  • Lastpage
    191
  • Abstract
    This is one of a series of ongoing interviews in IEEE Design & Test with well-known engineers in the electronics industry. In this interview, Ken Wagner talks with IBM Fellow Bob Dennard, the inventor of DRAM. In addition to his foundational work in DRAM, Dennard is also well-known for his work in CMOS process scaling.
  • Keywords
    CMOS process; CMOS technology; Design engineering; Educational institutions; Electronic equipment testing; Engineering profession; History; Integrated circuit technology; Medals; Random access memory; Bob Dennard; CMOS process scaling; IBM Fellow; inventor of DRAM;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.35
  • Filename
    4483822
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1123979