Title :
The commonality of vector generation techniques
Author_Institution :
Sun Microsystems
Abstract :
The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.
Keywords :
Automatic test pattern generation; Built-in self-test; Controllability; Drives; Logic testing; Mathematical model; Observability; Project management; Sun; ATPG; full scan; logic BIST; non-fault-directed test; output compression; semi-fault-directed test; test compression; vector generation;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2008.53
