• DocumentCode
    1124252
  • Title

    Digital Computation Makes AFCS More Reliable

  • Author

    Raymond, R.G. ; Larson, J.C.

  • Author_Institution
    Honeywell, Inc. Minneapolis, Minn. 55413
  • Issue
    5
  • fYear
    1975
  • Firstpage
    851
  • Lastpage
    861
  • Abstract
    In airline service the reliability of a system is more than the confirmed failures for the system; it is the total removal experience of the system. Thus, the reliability of a system lies not only in the piece part failure rates, but also in the capability to verify and isolate failures. The application of digital technology brings several significant reliability improvements to automatic flight control systems (AFCS) when compared to contemporary analog systems. These advantages are demonstrated by the experience of the digital air data computer (DADC) of the DC-10 and the digital AFCS of the JA-37 Viggen. Experience with this equipment is reviewed, and the results are interpreted in terms of projections for airline DAFCS reliability. The digital system built-in test implemented by a stored program and the central processor gives a system integrity and dispatch reliability unequaled by analog systems. This high-integrity self-test reduces removal rates by giving line personnel a trustworthy tool and more complete automatic test processes for verifying maintenance actions. Digital circuit technology is directly suitable to largescale integrated circuits (LSIC) which reduce piece part counts and improve LRU reliability. Digital circuits are less subject to drift and the attendant difficulty to detect failures. These factors, coupled with the inherent high-integrity self-test, provide the basis for a significant improvement in reliability by the use of a digital automatic flight control system.
  • Keywords
    Aerospace control; Application software; Automatic frequency control; Built-in self-test; Circuit testing; Digital circuits; Digital systems; Integrated circuit reliability; Isolation technology; Personnel;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/TAES.1975.307995
  • Filename
    4101499