DocumentCode
112426
Title
Aliasing Reduction in Accumulator-Based Response Verification
Author
Voyiatzis, Ioannis
Author_Institution
Dept. of Inf., Technol. Educ. Inst. of Athens, Athens, Greece
Volume
33
Issue
11
fYear
2014
fDate
Nov. 2014
Firstpage
1746
Lastpage
1750
Abstract
One of the well-known problems in response verification is aliasing, i.e., the event that a series of responses containing errors results in a signature equal to that of the error-free response sequence. In this paper, we propose a scheme to reduce aliasing in accumulator-based response verification. The proposed scheme is based on monitoring the value of the carry output of the accumulator. Experimental study indicates that the proposed scheme achieves significantly less hardware overhead for the same reduction in the aliasing probability than previously proposed schemes.
Keywords
built-in self test; integrated circuit testing; probability; accumulator-based response verification; aliasing probability; aliasing reduction; built-in self-test; circuit under test; Adders; Built-in self-test; Circuit faults; Compaction; Hardware; Monitoring; Probability; Accumulator-based response verification; aliasing probability; built-in self-test (BIST); time compaction;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2014.2351582
Filename
6926930
Link To Document