• DocumentCode
    112426
  • Title

    Aliasing Reduction in Accumulator-Based Response Verification

  • Author

    Voyiatzis, Ioannis

  • Author_Institution
    Dept. of Inf., Technol. Educ. Inst. of Athens, Athens, Greece
  • Volume
    33
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov. 2014
  • Firstpage
    1746
  • Lastpage
    1750
  • Abstract
    One of the well-known problems in response verification is aliasing, i.e., the event that a series of responses containing errors results in a signature equal to that of the error-free response sequence. In this paper, we propose a scheme to reduce aliasing in accumulator-based response verification. The proposed scheme is based on monitoring the value of the carry output of the accumulator. Experimental study indicates that the proposed scheme achieves significantly less hardware overhead for the same reduction in the aliasing probability than previously proposed schemes.
  • Keywords
    built-in self test; integrated circuit testing; probability; accumulator-based response verification; aliasing probability; aliasing reduction; built-in self-test; circuit under test; Adders; Built-in self-test; Circuit faults; Compaction; Hardware; Monitoring; Probability; Accumulator-based response verification; aliasing probability; built-in self-test (BIST); time compaction;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2014.2351582
  • Filename
    6926930