Title :
The Stochastic I-Pot: A Circuit Block for Programming Bias Currents
Author :
Serrano-Gotarredona, Rafael ; Camuñas-Mesa, Luis ; Serrano-Gotarredona, Teresa ; Leñero-Bardallo, Juan A. ; Linares-Barranco, Bernabé
Author_Institution :
Inst. de Microelectron. de Sevilla, Sevilla
Abstract :
In this brief, we present the "stochastic I-Pot." It is a circuit element that allows for digitally programming a precise bias current ranging over many decades, from pico-amperes up to hundreds of micro-amperes. I-Pot blocks can be chained within a chip to allow for any arbitrary number of programmable bias currents. The approach only requires to provide the chip with three external pins, the use of an external current measuring instrument, and a computer. This way, once all internal I-Pots have been characterized, they can be programmed through a computer to provide any desired current bias value with very low error. The circuit block turns out to be very practical for experimenting with new circuits (specially when a large number of biases are required), testing wide ranges of biases, introducing means for current mismatch calibration, offsets compensations, etc. using a reduced number of chip pins. We show experimental results of generating bias currents with errors of 0.38% (8 bits) for currents varying from 176 muA to 19.6 pA. Temperature effects are characterized.
Keywords :
CMOS analogue integrated circuits; analogue circuits; current-mode circuits; programmable circuits; CMOS process; analog circuits; chip pins; circuit block; current 176 muA to 19.6 pA; current mismatch calibration; current-mode circuit; low-power circuit; programmable bias currents; programmable current sources; reference currents; stochastic I-Pot; Band pass filters; CMOS process; Circuit testing; Current measurement; Instruments; Pins; Semiconductor device measurement; Stochastic processes; Transconductance; Tunneling; Analog circuits; current biases; current-mode circuits; low-power circuits; mismatch, programmable current sources; reference currents;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2007.900881