Title :
Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping
Author :
Lee, Jongjoo ; Yu, Sungkyu ; Kim, Joungho
Author_Institution :
Package Team, Samsung Electron., Kyunggi-Do, South Korea
fDate :
8/1/2002 12:00:00 AM
Abstract :
For the first time, the picosecond electric-pulse propagation characteristics of a few coplanar waveguide (CPW) components, including transmission lines, capacitive open and short terminations and a right-angle bend, have been successfully measured by mapping the time-dependent tangential near-electric-field distributions. The measurement was performed using a two-dimensional photoconductive (PC) near-field mapping system incorporating a recently developed novel PC electric-field probe, which could measure the separate picosecond orthogonal electric-field components with minimal loading effects. The resulting field-images mapped over the structural capacitive open termination and the short termination, showed previously unknown, and quite remarkable, transient picosecond electric-pulse reflection phenomena, which cannot be measured using conventional test instruments. In addition, the images showed that reflection-phenomenon itself required about 1 ps of propagation delay, and that the pulse-reflection from the capacitive open-termination required additional time delay matched to the length of the open-gap between the two slots of the CPW.
Keywords :
coplanar waveguide components; electric field measurement; electromagnetic wave propagation; measurement by laser beam; photoconducting devices; transient analysis; waveguide discontinuities; 1 ps; 2D photoconductive near-field mapping system; CPW components; capacitive open terminations; capacitive short terminations; coplanar waveguide components; coupled-slotline mode removal; field images; open-gap; picosecond electric-pulse propagation; pulse propagation characterization; right-angle bend; series-connected CPW discontinuities; tangential near-electric-field distributions; time-dependent electric field distributions; transient near-field mapping; transient ps electric pulse reflection phenomena; transmission lines; Coplanar transmission lines; Coplanar waveguides; Electric variables measurement; Performance evaluation; Photoconductivity; Power system transients; Probes; Time measurement; Transmission line measurements; Waveguide components;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2002.806801