• DocumentCode
    1124389
  • Title

    System embedded ADC calibration for OFDM receivers

  • Author

    Oh, Yangjin ; Murmann, Boris

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., CA
  • Volume
    53
  • Issue
    8
  • fYear
    2006
  • Firstpage
    1693
  • Lastpage
    1703
  • Abstract
    This paper describes a background calibration technique for analog-to-digital converters (ADCs) that exploits communication protocol redundancy to measure and correct for analog circuit imperfections. In particular, we consider the implementation of a 6-bit, 500-MS/s ADC in the receiver of an ultra wideband system using orthogonal frequency division multiplexing (OFDM). The calibration is intended for a time-interleaved array of successive approximation register ADCs and cancels converter nonlinearity due to inter-channel offset mismatches. The individual channel offsets are estimated through statistical correlation, based on known pseudorandom modulation sequences used in OFDM pilot tones. Our simulation results show that the proposed calibration is capable of improving the signal-to-noise and distortion ratio from 20 to 37 dB with a tracking time constant of 85 ms, assuming an additive white Gaussian noise channel with 20-dB signal-to-noise ratio
  • Keywords
    AWGN channels; OFDM modulation; analogue-digital conversion; calibration; channel estimation; random sequences; receivers; statistical analysis; ultra wideband communication; 6 bit; 85 ms; Gaussian noise channel; OFDM receivers; additive white noise; analog circuit imperfections; analog-to-digital converters; communication protocol redundancy; converter nonlinearity; embedded ADC calibration; interchannel offset mismatches; parallel processing; parameter estimation; pseudorandom modulation sequences; statistical correlation; successive approximation register; time-interleaved array; ultra wideband system; Additive white noise; Analog circuits; Analog-digital conversion; Calibration; Distortion; OFDM modulation; Protocols; Registers; Signal to noise ratio; Ultra wideband technology; Analog–digital (A/D) conversion; CMOS integrated circuits; calibration; communication standards; parallel processing; parameter estimation;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2006.879063
  • Filename
    1673639