DocumentCode
1124389
Title
System embedded ADC calibration for OFDM receivers
Author
Oh, Yangjin ; Murmann, Boris
Author_Institution
Dept. of Electr. Eng., Stanford Univ., CA
Volume
53
Issue
8
fYear
2006
Firstpage
1693
Lastpage
1703
Abstract
This paper describes a background calibration technique for analog-to-digital converters (ADCs) that exploits communication protocol redundancy to measure and correct for analog circuit imperfections. In particular, we consider the implementation of a 6-bit, 500-MS/s ADC in the receiver of an ultra wideband system using orthogonal frequency division multiplexing (OFDM). The calibration is intended for a time-interleaved array of successive approximation register ADCs and cancels converter nonlinearity due to inter-channel offset mismatches. The individual channel offsets are estimated through statistical correlation, based on known pseudorandom modulation sequences used in OFDM pilot tones. Our simulation results show that the proposed calibration is capable of improving the signal-to-noise and distortion ratio from 20 to 37 dB with a tracking time constant of 85 ms, assuming an additive white Gaussian noise channel with 20-dB signal-to-noise ratio
Keywords
AWGN channels; OFDM modulation; analogue-digital conversion; calibration; channel estimation; random sequences; receivers; statistical analysis; ultra wideband communication; 6 bit; 85 ms; Gaussian noise channel; OFDM receivers; additive white noise; analog circuit imperfections; analog-to-digital converters; communication protocol redundancy; converter nonlinearity; embedded ADC calibration; interchannel offset mismatches; parallel processing; parameter estimation; pseudorandom modulation sequences; statistical correlation; successive approximation register; time-interleaved array; ultra wideband system; Additive white noise; Analog circuits; Analog-digital conversion; Calibration; Distortion; OFDM modulation; Protocols; Registers; Signal to noise ratio; Ultra wideband technology; Analog–digital (A/D) conversion; CMOS integrated circuits; calibration; communication standards; parallel processing; parameter estimation;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2006.879063
Filename
1673639
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