Title :
A study of interference in synchronous systems
Author :
Yoshimura, Tsutomu ; Iwata, Atsushi
Author_Institution :
Mitsubishi Electr. Corp., Hyogo
Abstract :
The influence of interference and coupling in synchronous systems is investigated. Our new approach based on the linear time-variant model in oscillatory systems lends new insight into interference and coupling phenomena in synchronous systems. According to the analysis, it is possible that a small perturbation to an oscillator is enhanced by positive feedback through coupling with another oscillatory system. This implies that the inherent phase error caused by thermal noise can lead to a large amount of jitter by interference even in the absence of external noise. The analysis also reveals the relationship between the jitter occurrence and frequency difference in a plesiochronous system. Additionally, it is shown that the coupling within a closed-loop system can limit the bandwidth of a phase-locked loop and cause the peak gain of the response of the phase error. We confirmed these analytical results by measurements conducted on test chips
Keywords :
closed loop systems; coupled circuits; interference (signal); jitter; phase locked loops; phase noise; thermal noise; time-varying networks; closed-loop system; coupling phenomena; frequency difference; interference phenomena; jitter occurrence; linear time-variant model; oscillatory systems; phase error; phase-locked loop; plesiochronous system; synchronous systems; thermal noise; Bandwidth; Feedback; Frequency; Interference; Jitter; Oscillators; Phase locked loops; Phase noise; Semiconductor device measurement; Testing; Interference; feedback; jitter; mesochronous; phase noise; phase-locked loops (PLLs); power supply noise; stability; substrate noise; synchronization;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2006.879061
