Analytical and experimental verification of substrate noise spectrum for mixed-signal ICs

Author

Mendez, Miguel A. ; Mateo, Diego ; Rubio, Antonio ; Gonzalez, Jose Luis

Author_Institution

Electron. Eng. Dept., Univ. Politecnica de Catalunya, Barcelona

Volume

53

Issue

8

fYear

2006

Firstpage

1803

Lastpage

1815

Abstract

In this paper, the most relevant characteristics of the substrate noise spectrum for mixed-signal integrated circuits (ICs) are derived using a simple analytical model. These characteristics are related to parameters of the digital circuit, the package + printed circuit board parasitics, and other elements of the mixed-signal IC. The model used to derive the substrate noise spectral characteristics includes the statistical properties of the digital switching current waveform and the coupling transfer function between the digital power supply nodes and the substrate node of the victim circuitry. The results of the work are validated experimentally on a mixed-signal prototype

Keywords

integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; system-on-chip; coupling transfer function; digital noise; digital switching current waveform; integrated circuit modeling; mixed signal integrated circuits; substrate noise spectrum; system-on-chip; Analytical models; Coupling circuits; Digital circuits; Digital integrated circuits; Integrated circuit modeling; Integrated circuit noise; Integrated circuit packaging; Mixed analog digital integrated circuits; Printed circuits; Switching circuits; Digital noise; integrated circuit (IC) modeling; mixed analog–digital circuits; substrate noise; system-on-a-chip (SoC);

fLanguage

English

Journal_Title

Circuits and Systems I: Regular Papers, IEEE Transactions on

Publisher

ieee

ISSN

1549-8328

Type

jour

DOI

10.1109/TCSI.2006.879065

Filename

1673649