DocumentCode :
1124495
Title :
Analytical and experimental verification of substrate noise spectrum for mixed-signal ICs
Author :
Mendez, Miguel A. ; Mateo, Diego ; Rubio, Antonio ; Gonzalez, Jose Luis
Author_Institution :
Electron. Eng. Dept., Univ. Politecnica de Catalunya, Barcelona
Volume :
53
Issue :
8
fYear :
2006
Firstpage :
1803
Lastpage :
1815
Abstract :
In this paper, the most relevant characteristics of the substrate noise spectrum for mixed-signal integrated circuits (ICs) are derived using a simple analytical model. These characteristics are related to parameters of the digital circuit, the package + printed circuit board parasitics, and other elements of the mixed-signal IC. The model used to derive the substrate noise spectral characteristics includes the statistical properties of the digital switching current waveform and the coupling transfer function between the digital power supply nodes and the substrate node of the victim circuitry. The results of the work are validated experimentally on a mixed-signal prototype
Keywords :
integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; system-on-chip; coupling transfer function; digital noise; digital switching current waveform; integrated circuit modeling; mixed signal integrated circuits; substrate noise spectrum; system-on-chip; Analytical models; Coupling circuits; Digital circuits; Digital integrated circuits; Integrated circuit modeling; Integrated circuit noise; Integrated circuit packaging; Mixed analog digital integrated circuits; Printed circuits; Switching circuits; Digital noise; integrated circuit (IC) modeling; mixed analog–digital circuits; substrate noise; system-on-a-chip (SoC);
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2006.879065
Filename :
1673649
Link To Document :
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