• DocumentCode
    1124540
  • Title

    Topographic SAR interferometry formulation for high-precision DEM generation

  • Author

    Abdelfattah, Riadh ; Nicolas, Jean Marie

  • Author_Institution
    Lab. de Teledetection et Syst me d´´Inf., Ecole Nationale d´´Ingenieurs de Tunis, Tunisia
  • Volume
    40
  • Issue
    11
  • fYear
    2002
  • fDate
    11/1/2002 12:00:00 AM
  • Firstpage
    2415
  • Lastpage
    2426
  • Abstract
    In repeat-pass synthetic aperture radar (SAR) interferometry, the approximations, allowing the phase-to-height conversion, prevent high-resolution mapped relief. In this paper, we present a more general and exact formulation giving a new relationship between the interferogram phase and the target height. It is based on the interferometric SAR geometry and on a better expansion of the path length difference between the sensor and the target. This formulation emphasizes the impact of baseline uncertainties on digital elevation model (DEM) accuracy. A quantitative assessment of the required baseline accuracy is computed. The impact of orbital parameters, used in the new formulation, on interferogram generation is studied. Thus, a new simulator algorithm is developed and tested on a set of reference and simulated DEM examples. Examples of interferogram simulation and DEM generation validate this new approach in the case of a mountainous area in Mustang (Nepal).
  • Keywords
    geophysical techniques; radar theory; remote sensing by radar; spaceborne radar; synthetic aperture radar; terrain mapping; topography (Earth); DEM generation; InSAR; SAR geometry; SAR interferometry; approximation; digital elevation model; exact formulation; geophysical measurement technique; high precision; interferogram phase; land surface topography; path length difference; phase-to-height conversion; radar remote sensing; relief; repeat pass method; simulator algorithm; synthetic aperture radar; target height; terrain mapping; Computational modeling; Data mining; Digital elevation models; Geometry; Radar imaging; Surface topography; Synthetic aperture radar; Synthetic aperture radar interferometry; Testing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/TGRS.2002.805071
  • Filename
    1166600