DocumentCode :
1124556
Title :
On Detecting Edges
Author :
Nalwa, Vishvjit S. ; Binford, Thomas O.
Author_Institution :
Artificial Intelligence Laboratory and the Information Systems Laboratory, Stanford University, Stanford, CA 94305.
Issue :
6
fYear :
1986
Firstpage :
699
Lastpage :
714
Abstract :
An edge in an image corresponds to a discontinuity in the intensity surface of the underlying scene. It can be approximated by a piecewise straight curve composed of edgels, i.e., short, linear edge-elements, each characterized by a direction and a position. The approach to edgel-detection here, is to fit a series of one-dimensional surfaces to each window (kernel of the operator) and accept the surface-description which is adequate in the least squares sense and has the fewest parameters. (A one-dimensional surface is one which is constant along some direction.) The tanh is an adequate basis for the stepedge and its combinations are adequate for the roofedge and the line-edge. The proposed method of step-edgel detection is robust with respect to noise; for (step-size/¿noise) ¿ 2.5, it has subpixel position localization (¿position < ¿) and an angular localization better than 10°; further, it is designed to be insensitive to smooth shading. These results are demonstrated by some simple analysis, statistical data, and edgelimages. Also included is a comparison of performance on a real image, with a typical operator (Difference-of-Gaussians). The results indicate that the proposed operator is superior with respect to detection, localization, and resolution.
Keywords :
Artificial intelligence; Image edge detection; Information systems; Kernel; Laboratories; Layout; Least squares approximation; Least squares methods; Noise robustness; Surface fitting; Adequate basis for step-edges; digital image processing; directional edge operator; edge-detection; image segmentation; one-dimensional surface-fitting; subpixel edge localization;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.1986.4767852
Filename :
4767852
Link To Document :
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