DocumentCode :
1124715
Title :
Novel reworkable fluxing underfill for board-level assembly
Author :
Zhang, Zhuqing ; Li, Haiying ; Wong, C.P.
Author_Institution :
Eng. & Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
27
Issue :
3
fYear :
2004
Firstpage :
525
Lastpage :
532
Abstract :
Underfills are traditionally applied for flip-chip applications. Recently, there has been increasing use of underfill for board-level assembly including ball grid arrays (BGAs) and chip scale packages (CSPs) to enhance reliability in harsh environments and impact resistance to mechanical shocks. The no-flow underfill process eliminates the need for capillary flow and combines fluxing and underfilling into one process step, which simplifies the assembly of underfilled BGAs and CSPs for SMT applications. However, the lack of reworkability decreases the final yield of assembled systems. In this paper, no-flow underfill formulations are developed to provide fluxing capability, reworkability, high impact resistance, and good reliability for the board-level components. The designed underfill materials are characterized with the differential scanning calorimeter (DSC), the thermal mechanical analyzer (TMA), and the dynamic mechanical analyzer (DMA). The potential reworkability of the underfills is evaluated using the die shear test at elevated temperatures. The 3-point bending test and the DMA frequency sweep indicate that the developed materials have high fracture toughness and good damping properties. CSP components are assembled on the board using developed underfill. High interconnect yield is achieved. Reworkability of the underfills is demonstrated. The reliability of the components is evaluated in air-to-air thermal shock (AATS). The developed formulations have potentially high reliability for board-level components.
Keywords :
assembling; ball grid arrays; chip scale packaging; differential scanning calorimetry; filler metals; flip-chip devices; fracture toughness; printed circuit manufacture; reliability; surface mount technology; 3-point bending test; DMA frequency sweep; SMT applications; air-to-air thermal shock; ball grid arrays; board-level assembly; board-level components; capillary flow; chip scale packages; damping properties; die shear test; differential scanning calorimeter; dynamic mechanical analyzer; elevated temperatures; flip-chip applications; fluxing capability; fracture toughness; impact resistance; mechanical shocks; no-flow underfill process; reworkability; reworkable fluxing underfill; thermal mechanical analyzer; underfill materials; underfilled BGA; underfilled CSP; Assembly systems; Chip scale packaging; Electric shock; Electronics packaging; Soldering; Surface-mount technology; Temperature; Thermal expansion; Thermal stresses; Vehicle dynamics; Assembly; material properties; reliability; reworkable; underfill;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2004.831836
Filename :
1339452
Link To Document :
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