• DocumentCode
    112491
  • Title

    Mott Memory and Neuromorphic Devices

  • Author

    You Zhou ; Ramanathan, Shriram

  • Author_Institution
    John A. Paulson Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
  • Volume
    103
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    1289
  • Lastpage
    1310
  • Abstract
    Orbital occupancy control in correlated oxides allows the realization of new electronic phases and collective state switching under external stimuli. The resultant structural and electronic phase transitions provide an elegant way to encode, store, and process information. In this review, we examine the utilization of Mott metal-to-insulator transitions, for memory and neuromorphic devices. We emphasize the overarching electron-phonon coupling and electron-electron interaction-driven transition mechanisms and kinetics, which renders a general description of Mott memories from aspects such as nonvolatility, sensing scheme, read/write speed, and switching energy. Various memory and neuromorphic device architectures incorporating phase transition elements are reviewed, focusing on their operational principles. The role of Peierls distortions and crystal symmetry changes during phase change is discussed. Prospects for such orbitronic devices as hardware components for information technologies are summarized.
  • Keywords
    Peierls instability; metal-insulator transition; neural nets; phase transformations; random-access storage; Mott memory devices; Mott metal-to-insulator transitions; Peierls distortions; collective state switching; crystal symmetry; electron-electron interaction-driven transition mechanisms; electron-phonon coupling; electronic phase transitions; information technologies; neuromorphic devices; orbital occupancy control; orbitronic devices; phase change; phase transition elements; read-write speed; sensing scheme; switching energy; Encoding; Information processing; Insulators; Magnetic hysteresis; Memory management; Neuromorphics; Random access memory; Complex oxide; Mott insulator; emerging memory; metal oxide; metal-to-insulator transition; neuromorphics; nonvolatile; orbitronics;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2015.2431914
  • Filename
    7137616