DocumentCode
1125209
Title
Improvement of aging simulation of electronic circuits using behavioral modeling
Author
Marc, Francois ; Mongellaz, Benoit ; Bestory, Corinne ; Levi, Hervw ; Danto, Yves
Author_Institution
Lab. IXL, Univ. Bordeaux, Talence
Volume
6
Issue
2
fYear
2006
fDate
6/1/2006 12:00:00 AM
Firstpage
228
Lastpage
234
Abstract
This paper presents an original method of analog circuits aging simulation. This method is based on a behavioral modelling of circuits that includes the effects of degradations on circuit parameters, on the basis of transistors aging. The efficiency of the method is demonstrated in the case of hot carriers degradation in an amplifier
Keywords
ageing; analogue integrated circuits; circuit simulation; hot carriers; integrated circuit modelling; integrated circuit reliability; amplifier; analog circuits aging simulation; behavioral modeling; behavioral modelling; circuit parameters; electronic circuits; hot carriers degradation; integrated circuit reliability; transistor aging; Aging; Analog circuits; Circuit simulation; Computational modeling; Degradation; Electronic circuits; Hot carriers; MOSFETs; Stress; Voltage; Electronics; hot carriers; reliability modelling;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2006.879117
Filename
1673715
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