Title :
On Peculiarities of S-Parameter Measurements
Author :
Rolain, Yves ; Van Moer, Wendy ; Jargon, Jeffrey A. ; DeGroot, Donald C.
Author_Institution :
Vrije Univ. Brussels, Brussels
Abstract :
Extracting quantities, such as the propagation factor or the characteristic impedance of a transmission line based on measured S-parameters, can be more involved than expected. Experience teaches that even if the S-parameter measurements look smooth and are of good quality, the derived quantities can contain large spikes that tend to grow when connection imperfections are present. In this paper, the presence of the peaks is shown in practical measurements, a possible explanation for their presence is provided, and a sensitive indicator (the image parameters) for the imperfections is proposed.
Keywords :
S-parameters; microwave measurement; transmission lines; S-parameter measurement; characteristic impedance; propagation factor; sensitive indicator; transmission line; Force measurement; Frequency measurement; Impedance measurement; Microwave measurements; Permittivity measurement; Propagation constant; Radio frequency; Scattering parameters; Transmission line measurements; Transmission lines; $S$-parameters; Characteristic impedance; microwave measurements; propagation constant;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.895581