DocumentCode :
1125383
Title :
Sparse Decompositions for Exploratory Pattern Analysis
Author :
Hoffman, Richard L. ; Jain, Anil K.
Author_Institution :
Department of Computer Science, Michigan State University, East Lansing, MI 48824; Department of Electrical Engineering and Computer Science, University of Illinois at Chicago, Chicago, IL 60680.
Issue :
4
fYear :
1987
fDate :
7/1/1987 12:00:00 AM
Firstpage :
551
Lastpage :
560
Abstract :
We define and verify the utility of a pattern analysis procedure called sparse decomposition. This technique involves sequentially ``peeling´´ sparse subsets of patterns from a pattern set, where sparse subsets are sets of patterns which possess a certain degree of regularity or compactness as measured by a compactness measure c. If this is repeated until all patterns are deleted, then the sequence of decomposition ``layers´´ derived by this procedure provides a wealth of information from which inferences about the original pattern set may be made. A statistic P is derived from this information and is shown to be powerful in detecting clustering tendency for data in reasonably compact sampling windows. The test is applied to both synthetic and real data.
Keywords :
Computer science; Data analysis; Extraterrestrial measurements; Pattern analysis; Pattern recognition; Sampling methods; Spatial resolution; Statistics; Testing; Clustering tendency; minimal spanning tree; spatial point process; spatial uniformity;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.1987.4767942
Filename :
4767942
Link To Document :
بازگشت