DocumentCode :
1125512
Title :
Memory performance prediction for high-performance microprocessors at deep submicrometer technologies
Author :
Zeng, Annie ; Rose, Kenneth ; Gutmann, Ronald J.
Author_Institution :
Dept. of Electr. Eng., Rensselaer Polytech. Inst., Troy, NY
Volume :
25
Issue :
9
fYear :
2006
Firstpage :
1705
Lastpage :
1718
Abstract :
The desire for large size, high-speed, and low-power on-chip memory necessitates early and accurate estimates of memory performance. A new performance model as well as an early cache design tool and predictor of access and cycle time for cache stack (PRACTICS) has been developed for on-chip static random access memory (SRAM) cache design that includes both delay and dynamic-power models. Efficient models for distributed interconnect delays, verified by Cadence simulations, are introduced, and their necessity is demonstrated. In the delay model, the access time is estimated by decomposing each component into several equivalent lumped resistance-capacitance (RC) circuits and using an appropriate order pi model to approximate the distributed wire delays of each stage. The dynamic-power model calculates the charging power dissipation of the load capacitances using the same equivalent lumped RC circuits. The delay model has been validated with an Intel 18-Mb SRAM at the 180-nm node, achieving accuracy to within 10% of the measured results. The dynamic-power model has been validated with an International Business Machines Corporation (IBM) 18-Mb SRAM at the 180-nm node, to within 13% of the measured power consumption. Detailed comparisons between PRACTICS and cache access and cycle time model (CACTI) in both validation cases indicate that an improved wire delay, appropriate circuit structures, and technology dependent parameters are necessary to accurately predict large cache memory performance at deep submicrometer technology nodes. PRACTICS is used to analyze the access time and power consumption in terms of cache sizes and various degrees of associativity for architectural studies. In addition, the PRACTICS simulation results show that repeater insertion reduces the access time significantly, with a small overhead in dynamic-power consumption for large size cache design at deep submicrometer technology
Keywords :
RC circuits; SRAM chips; cache storage; equivalent circuits; integrated circuit design; integrated circuit modelling; microprocessor chips; 18 Mbyte; 180 nm; Cadence simulation; PRACTICS; RC circuit; SRAM; access time predictor; cache cycle time; cache design; cache size; cycle time predictor; distributed interconnect delay; distributed resistance-capacitance; high-performance microprocessors; lumped resistance-capacitance; memory architecture; memory performance prediction; static random access memory; submicrometer technology; Appropriate technology; Circuit simulation; Delay effects; Delay estimation; Energy consumption; Microprocessors; Predictive models; Random access memory; SRAM chips; Wire; Cache access time; cache cycle time; distributed resistance–capacitance (RC) model; lumped resistance–capacitance (RC) model; memory architecture; static random access memory (SRAM);
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2005.858346
Filename :
1673745
Link To Document :
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