• DocumentCode
    11259
  • Title

    Maximum Sample Volume for Permittivity Measurements by Cavity Perturbation Technique

  • Author

    Zhiwei Peng ; Jiann-Yang Hwang ; Andriese, Matthew

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Michigan Technol. Univ., Houghton, MI, USA
  • Volume
    63
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    450
  • Lastpage
    455
  • Abstract
    The maximum sample volume for accurate permittivity measurements of dielectric materials having various geometries (rod/bar, strip/disk, and sphere) by cavity perturbation technique has been investigated by determining the maximum volume ratio of sample to cavity (Vs/Vc)max based on analysis of the measurement theory. It is demonstrated that (Vs/Vc)max of a dielectric rod/bar with the height equal to that of resonant cavity relies exclusively on the relative dielectric constant, whereas (Vs/Vc)max of a dielectric strip/disk or sphere depends on both the relative dielectric constant and the dielectric loss factor. There is a relatively weak permittivity dependence of (Vs/Vc)max for dielectric property measurements of dielectric strips/disks compared with rods/bars or spheres. The maximum sample volume used in the measurements for different sample geometries follows the order: . Comparison between (Vs/Vc)max of low-loss Al2O3 and high-loss SiC reveals that low-loss materials can have a larger sample volume than high-loss materials for measurement. High-loss materials may require a strip/disk geometry to meet the measurement requirements. The variation in (Vs/Vc)max of Al2O3 having different geometries in a broad temperature range up to ~ 1400°C shows that (Vs/Vc)max of the sample decreases with increasing temperature and the change in (Vs/Vc)max should be considered during the high-temperature permittivity measurements.
  • Keywords
    aluminium compounds; dielectric devices; dielectric loss measurement; dielectric materials; measurement theory; permittivity measurement; perturbation techniques; silicon compounds; Al2O3; SiC; dielectric constant; dielectric loss factor; dielectric material; dielectric property measurement; dielectric rod-bar; dielectric sphere; dielectric strip-disk; geometry; high-temperature permittivity measurement; maximum sample volume ratio; measurement theory; relative dielectric constant; resonant cavity perturbation technique; Cavity resonators; Dielectrics; Materials; Permittivity; Permittivity measurement; Temperature measurement; Cavity perturbation technique (CPT); frequency shift; permittivity measurement; sample geometry; temperature; volume;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2279496
  • Filename
    6600967