DocumentCode :
1125901
Title :
Design Considerations for 1.3 \\mu m GaNAsSb–GaAs High Speed and High Quantum Efficiency Waveguide Photodetectors
Author :
Xu, Z. ; Yoon, S.F. ; Loke, W.K. ; Ngo, C.Y. ; Tan, K.H. ; Wicaksono, S. ; Saadsaoud, N. ; Decoster, D. ; Zegaoui, M. ; Chazelas, J.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume :
27
Issue :
13
fYear :
2009
fDate :
7/1/2009 12:00:00 AM
Firstpage :
2518
Lastpage :
2524
Abstract :
The electrical and optical characteristics of a 1.3 mum GaNAsSb-GaAs p-i-n waveguide photodetector (WGPD), consisting of GaAs inner and AlxGa1-xAs outer cladding layers, were simulated using a lumped-element model and finite difference beam propagation method (BPM). The effect of multiple cladding layers´ thicknesses and aluminum composition on the quantum efficiency was investigated to provide design guide and deduce the range of parameters needed for achieving quantum efficiency higher than 89%. The simulation shows that a p-i-n waveguide structure with 10 mum length, 4 mum ridge width, 2.4 mum ridge height and 0.4 mum GaN0.033As0.887Sb0.08 core layer thickness can exhibit a theoretical cut-off frequency limit of over 80 GHz. Maximum quantum efficiency of 91.5% can be obtained for this structure with cladding layer thickness of 0.5 mum for GaAs and 0.5 mum for Al 0.7Ga0.3As.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; p-i-n diodes; photodetectors; GaNAsSb-GaAs; cut-off frequency limit; finite difference beam propagation method; p-i-n waveguide photodetector; quantum efficiency; ridge height; waveguide photodetectors; wavelength 1.3 micron; Aluminum; Cutoff frequency; Finite difference methods; Gallium arsenide; Gallium nitride; Optical propagation; Optical waveguides; PIN photodiodes; Photodetectors; Waveguide theory; Dilute-nitride; GaNAsSb; optimization; waveguide photodetector (WGPD);
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2009.2013323
Filename :
5153572
Link To Document :
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