• DocumentCode
    112610
  • Title

    Polarization-Engineered High-Efficiency GaInN Light-Emitting Diodes Optimized by Genetic Algorithm

  • Author

    Dong Yeong Kim ; Guan-Bo Lin ; Sunyong Hwang ; Jun Hyuk Park ; Meyaard, David ; Schubert, E. Fred ; Han-Youl Ryu ; Jong Kyu Kim

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
  • Volume
    7
  • Issue
    1
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    A genetic algorithm is employed to find an optimum epitaxial structure of multiple quantum wells (MQWs) and electron-blocking layer (EBL) for a GaInN-based light-emitting diode (LED). The optimized LED is composed of locally Si-doped quantum barriers (QBs) in the MQWs and a quaternary heterostructured AlGaInN EBL having a polarization-induced electric field directed oppositely to that of a conventional AlGaN EBL. The optimized LED shows 15.6% higher internal quantum efficiency, 24.6% smaller efficiency droop, and 0.21 V lower forward voltage at 200 A/cm2 comparing to the reference LED, which has fully Si-doped QB and 20-nm-thick Al0.19Ga0.81N EBL. We find that local Si doping near the QB/QW interface compensates the negative polarization-induced sheet charge at the interface and reduces electric field in the QWs, thereby enhancing electron-hole wave function overlap. In addition, the inverted polarization field in the quaternary EBL provides a high barrier for electrons but a low barrier for holes, resulting in enhanced electron-blocking and hole-injection characteristics.
  • Keywords
    III-V semiconductors; aluminium compounds; electric fields; elemental semiconductors; gallium compounds; genetic algorithms; indium compounds; light emitting diodes; semiconductor doping; semiconductor quantum wells; silicon; wide band gap semiconductors; AlGaInN; EBL; LED; electron-blocking layer; genetic algorithm; hole-injection; light-emitting diodes; multiple quantum wells; negative polarization-induced sheet; polarization-induced electric field; quantum barriers; size 20 nm; voltage 0.21 V; Doping; Electric fields; Genetic algorithms; Light emitting diodes; Optimization; Quantum well devices; Silicon; Genetic algorithm; Light-emitting diodes; Polarization-engineering; genetic algorithm; polarization engineering;
  • fLanguage
    English
  • Journal_Title
    Photonics Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0655
  • Type

    jour

  • DOI
    10.1109/JPHOT.2014.2387263
  • Filename
    7001042