DocumentCode :
1126318
Title :
Properties of Low Precision Analog-to-Digital Converters
Author :
Collins, F.A. ; Sicking, C.J.
Author_Institution :
Applied Research Laboratories, The University of Texas at Austin, Austin, TX 78712
Issue :
5
fYear :
1976
Firstpage :
643
Lastpage :
646
Abstract :
The problem of quantization and saturation noise introduced by the process of analog-to-digital conversion is addressed. Analog-to-digital converters (ADC) with even versus odd numbers of output states are compared. Expressions are derived and evaluated which yield the signal-to-noise ratio and the gain versus signal level input when the input signal has an assumed Gaussian probability density. The results presented should have application in all fields in which digital signal processing is performed.
Keywords :
Analog-digital conversion; Bulk storage; Digital signal processing; Distortion; Hysteresis; Input variables; Laboratories; Quantization; Signal processing; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9251
Type :
jour
DOI :
10.1109/TAES.1976.308268
Filename :
4101711
Link To Document :
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