• DocumentCode
    1126601
  • Title

    Thermal index changes by optical absorption in group III-V semiconductor waveguides

  • Author

    Gabriel, M.C. ; Haus, H.A. ; Ippen, Erich

  • Author_Institution
    AT&T Bell Laboratories, Holmdel, NJ, USA
  • Volume
    4
  • Issue
    10
  • fYear
    1986
  • fDate
    10/1/1986 12:00:00 AM
  • Firstpage
    1482
  • Lastpage
    1493
  • Abstract
    Large fast-relaxing intensity-dependent refractive index changes would make certain all-optical signal processing devices in waveguides feasible. In III-V compound materials, light-induced index changes can arise from any of several physical mechanisms which have different strengths and relaxation times. Index changes from 1.06-μm pulsed and CW Nd: YAG laser excitation were measured in single-mode low-loss InP and GaAs waveguide Fabry-Perot structures. The dominant effect was found to be due to heating of the waveguide volume which accompanies an extremely small amount of free-carrier absorption.
  • Keywords
    Optical refraction; Semiconductor waveguides; Absorption; III-V semiconductor materials; Optical refraction; Optical signal processing; Optical variables control; Optical waveguides; Pulse measurements; Refractive index; Semiconductor waveguides; Waveguide transitions;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.1986.1074658
  • Filename
    1074658