Title :
A Novel Method to Measure the Internal Quantum Efficiency and Optical Loss of Laser Diodes
Author :
Wang, Y. ; Gong, Q. ; Cao, C.F. ; Cheng, R.H. ; Yan, J.Y. ; Yue, L. ; Li, Y.Y. ; Li, A.Z. ; Wang, S.M. ; Cui, J. ; Xu, H.X. ; Wang, H.L. ; Li, S.G.
Author_Institution :
State Key Lab. of Functional Mater. for Inf., Shanghai Inst. of Microsyst. & Inf. Technol., Shanghai, China
Abstract :
We present a novel method to characterize the internal quantum efficiency and internal optical loss of semiconductor lasers. Its basic concept is studying the dependence of the external quantum efficiency on the mirror reflectivity. This method is very different from the conventional one, which focuses on the external quantum efficiency as a function of cavity length. Our method has great advantages, such as the capability of measuring the internal quantum efficiency and optical loss of a single laser diode, which is intrinsically impossible by the conventional method.
Keywords :
laser beams; laser cavity resonators; laser mirrors; laser variables measurement; optical losses; reflectivity; semiconductor lasers; cavity length; conventional method; external quantum efficiency; internal optical loss; internal quantum efficiency; mirror reflectivity; semiconductor lasers; single laser diode; Cavity resonators; Optical losses; Optical reflection; Optical scattering; Optical variables measurement; Reflectivity; Semiconductor lasers; Internal quantum efficiency; internal optical loss; semiconductor lasers;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2015.2413991
