• DocumentCode
    1126892
  • Title

    The respective roles of UV photons and oxygen atoms in plasma sterilization at reduced gas pressure: the case of N2-O2 mixtures

  • Author

    Philip, Nicolas ; Saoudi, Bachir ; Crevier, Marie-Charlotte ; Moisan, Michel ; Barbeau, Jean ; Pelletier, Jacques

  • Author_Institution
    Groupe de Phys. des Plasmas, Univ. de Montreal, Canada
  • Volume
    30
  • Issue
    4
  • fYear
    2002
  • fDate
    8/1/2002 12:00:00 AM
  • Firstpage
    1429
  • Lastpage
    1436
  • Abstract
    In the reduced-pressure (≤10 torr) afterglow stemming from discharges in O2- containing mixtures such as N2-O2, the test-reference spores are ultimately inactivated by UV photons through destruction of their genetic material (DNA). To show this, we assume the inactivation to result from a sufficiently large number of successful hits of the DNA strands by UV photons. This implies that the higher the UV intensity, the shorter the time required to reach the lethal dose. Simultaneously, the increased erosion of the spores by the oxygen atoms as time elapses reduces the incident number of photons required to meet the lethal dose. Erosion, as observed by scanning electron microscopy, also increases with the O2 percentage in the mixture. Actually, sterilization time is found to be the shortest when the O2 percentage in the mixture is set to maximize the UV emission intensity, which occurs at O2 percentages typically below 2%, where erosion is low. This proves the predominant role of UV radiation over erosion as far as spore inactivation is concerned. In any case, plasma sterilization always implies some erosion of the test spores, in contrast to what happens with conventional sterilization methods.
  • Keywords
    DNA; biological effects of radiation; biological techniques; molecular biophysics; plasma applications; scanning electron microscopy; DNA; N2-O2 mixtures; O atoms; UV photons; afterglow; genetic material destruction; lethal dose; plasma sterilization; reduced gas pressure; scanning electron microscopy; test-reference spores; Computer aided software engineering; DNA; Diseases; Electrons; Fungi; Genetics; Materials testing; Oxygen; Plasma chemistry; Plasma temperature;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.804203
  • Filename
    1167635