DocumentCode :
112699
Title :
High-Fill-Factor 60\\times 1 SPAD Array With 60 Subnanosecond Integrated TDCs
Author :
Villa, Federica ; Lussana, Rudi ; Tamborini, Davide ; Tosi, Alberto ; Zappa, Franco
Author_Institution :
Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
Volume :
27
Issue :
12
fYear :
2015
fDate :
June15, 15 2015
Firstpage :
1261
Lastpage :
1264
Abstract :
This letter presents a high-fill-factor 60 × 1 linear array of single-photon avalanche diodes (SPADs) and 60 integrated time-to-digital converters (TDCs). The 100-μm diameter SPAD has high photon detection efficiency (50% at 420 nm), very low dark count rate (2.5 kcps at room temperature), and negligible crosstalk (~0.1% between adjacent pixels). The TDC resolution is 250 ps and its single-shot precision of 200-ps rms is limited just by the quantization noise. Very good linearity (DNL = 5% LSB rms and INL = 30% LSB rms) is achieved because of the sliding scale technique. The overall fill-factor of the array is 52%. This chip is suitable for many advanced spectroscopic applications, since it provides 60 independent single-photon detectors and the corresponding counting and timing electronics within just one integrated circuit.
Keywords :
CMOS image sensors; avalanche photodiodes; integrated optics; optical arrays; optical crosstalk; photodetectors; photon counting; time-digital conversion; LSB rms; TDC resolution; advanced spectroscopic applications; counting electronics; crosstalk; dark count rate; high-fill-factor SPAD array; high-fill-factor linear array; independent single-photon detectors; integrated TDC; integrated circuit; integrated time-to-digital converters; overall fill-factor; photon detection efficiency; quantization noise; single-photon avalanche diodes; single-shot precision; size 100 mum; sliding scale technique; temperature 293 K to 298 K; time 200 ps; time 250 ps; time 60 ns; timing electronics; wavelength 420 nm; Arrays; CMOS integrated circuits; Clocks; Crosstalk; Logic gates; Photonics; Timing; CMOS imagers; Single-Photon Avalanche-Diode (SPAD); Single-photon avalanche-diode (SPAD); Spectroscopy; Time-Correlated Single-Photon Counting (TCSPC); Time-of-Flight (TOF) measurements; Time-to-Digital Converter (TDC); spectroscopy; time-correlated single-photon counting (TCSPC); time-of-flight (TOF) measurements; time-to-digital converter (TDC);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2015.2416192
Filename :
7066959
Link To Document :
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