A Comparison of Redundant Inverter Topologies to Improve Voltage Source Inverter Reliability

Author

Julian, Alexander L. ; Oriti, Giovanna

Author_Institution

Naval Postgraduate Sch., Monterey

Volume

43

Issue

5

fYear

2007

Firstpage

1371

Lastpage

1378

Abstract

For applications sensitive to reliability, typical voltage-source inverters (VSIs) cannot always meet the reliability requirements. In these cases, some method of redundancy is used to improve system reliability. This paper compares the reliability of two redundant VSI circuit topologies to a typical VSI circuit. The redundant circuits function normally after the failure (open or short) of any single component, including the controller, current and voltage sensors, capacitors, insulated gate bipolar transistors, and power diodes. The parts count method of reliability comparison that is described in MIL-HDBK-217F is used to compare the reliability functions for the three circuit topologies.

Keywords

circuit reliability; invertors; network topology; redundancy; circuit topologies; mean time between failure; redundant circuits; redundant inverter topologies; voltage source inverter reliability; Circuits; Clamps; Diodes; Insulated gate bipolar transistors; Inverters; Power system reliability; Redundancy; Switches; Topology; Voltage; Mean time between failure (MTBF); redundancy; reliability; voltage-source inverter (VSI);

fLanguage

English

Journal_Title

Industry Applications, IEEE Transactions on

Publisher

ieee

ISSN

0093-9994

Type

jour

DOI

10.1109/TIA.2007.904436

Filename

4305322