• DocumentCode
    1127078
  • Title

    Reinforcement of linear structure using parametrized relaxation labeling

  • Author

    Duncan, James S. ; Birkhölzer, Thomas

  • Author_Institution
    Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
  • Volume
    14
  • Issue
    5
  • fYear
    1992
  • fDate
    5/1/1992 12:00:00 AM
  • Firstpage
    502
  • Lastpage
    515
  • Abstract
    The problem of reinforcing local evidence of linear structure while suppressing unwanted information in noisy images is considered, using a modified form of relaxation labeling. The methodology is based on parametrizing a continuous set of orientation labels via a single vector and using a sigmoidal thresholding function to bias neighborhood influence and ensure convergence to a meaningful stable state. Label strength and label/no-label decisions are incorporated into a single functional. Optimal points of the functional represent the cases where as many pixels (objects) as possible have achieved the desirable linear-structure-reinforced and noise-suppressed labelings. Three different linear structure reinforcement tasks are considered within the general framework: edge reinforcement, edge reinforcement with thinning, and bar (line segment) reinforcement. Results from several image data sets are presented. This approach can directly handle continuous feature information from low-level image analysis operators, and the computational complexity of labeling is reduced
  • Keywords
    computational complexity; picture processing; bar reinforcement; computational complexity; convergence; edge reinforcement; information suppression; label strength; line segment reinforcement; linear structure reinforcement; local evidence; neighbourhood influence biassing; noise-suppressed labelings; noisy images; orientation labels; parametrized relaxation labeling; sigmoidal thresholding function; thinning; Computed tomography; Convergence; Ear; Image analysis; Image edge detection; Image motion analysis; Image segmentation; Image texture analysis; Labeling; Pixel;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.134056
  • Filename
    134056