Transmission properties of metal-semiconductor-relaxor microstrip lines

Author

Fiallo, Héctor H. ; Dougherty, Joseph P. ; Sei-Joo Jang ; Newnham, Robert E. ; Carpenter, Lynn A.

Author_Institution

Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA

Volume

42

Issue

7

fYear

1994

fDate

7/1/1994 12:00:00 AM

Firstpage

1176

Lastpage

1182

Abstract

The transmission characteristics of multilayer ferrite-high-K microstrip lines have been calculated by means of the parallel-plate waveguide approximation. The relaxation behavior of the dielectric permittivity and permeability have been taken into account by using the Debye and the Maxwell-Wagner relaxation models. The results demonstrate that these lines can be used as very small size delay lines and low-pass filters that can be tuned by adjusting the layer thickness ratio, the resistivity of the semiconductor layer, and the difference between the permittivity-permeability product of each layer

Keywords

ferrite applications; frequency response; microstrip lines; permeability; permittivity; relaxation; waveguide theory; Debye relaxation model; Maxwell-Wagner relaxation model; delay lines; dielectric permeability; dielectric permittivity; low-pass filters; metal-semiconductor-relaxor microstrip lines; multilayer ferrite-high-K microstrip lines; parallel-plate waveguide approximation; relaxation behavior; semiconductor layer resistivity; transmission characteristics; Conductivity; Delay lines; Dielectric substrates; Ferrites; Frequency; Low pass filters; Microstrip; Nonhomogeneous media; Permeability; Permittivity;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.299754

Filename

299754