• DocumentCode
    1127178
  • Title

    Modeling Electrostatic Discharge Affecting GMR Heads

  • Author

    Soda, Yutaka

  • Author_Institution
    Sony Corp., Tagajo
  • Volume
    43
  • Issue
    5
  • fYear
    2007
  • Firstpage
    1144
  • Lastpage
    1148
  • Abstract
    Electrostatic discharge (ESD) damage to giant magnetoresistive (GMR) heads is investigated using a charged device model tester. The sensor of a GMR head is easily affected by ESD during handling in production. Simulation of the picking procedure reveals that elevating such a small-capacitance device above the work surface increases the potential by up to ten times and the discharge current by up to five times. With 20-V initial potential, which could be applied by the picking tool, the elevation of a 5-pF capacitance by just 10 mm increases the potential to 200 V and the peak discharge current to 578 mA. In the case of a 1-pF capacitor, however, the potential and peak current remained low due to the effect of stray capacitance. In the case of a GMR head with 3.7-pF capacitance, a 5-mm lift reduced the initial potential causing ESD damage from 60 V to less than 40 V. Waveforms of discharge reveal that the GMR head can be designed to reduce the ESD risk.
  • Keywords
    electrostatic discharge; giant magnetoresistance; magnetic heads; magnetoresistive devices; ESD damage; GMR heads; charged device model; electrostatic discharge; giant magnetoresistive heads; picking procedure; small-capacitance device; stray capacitance; Capacitance; Capacitors; Current measurement; Electrical resistance measurement; Electrostatic discharge; Flexible printed circuits; Giant magnetoresistance; Magnetic heads; Magnetic sensors; Testing; Device elevation; electrostatic discharge (ESD); giant magnetoresistive (GMR) head;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2007.904364
  • Filename
    4305336