• DocumentCode
    1127282
  • Title

    Backscattering from a randomly rough dielectric surface

  • Author

    Fung, Adrian K. ; Li, Zongqian ; Chen, K.S.

  • Author_Institution
    Wave Scattering Res. Center, Texas Univ., Arlington, TX, USA
  • Volume
    30
  • Issue
    2
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    356
  • Lastpage
    369
  • Abstract
    A backscattering model for scattering from a randomly rough dielectric surface is developed. Both like- and cross-polarized scattering coefficients are obtained. The like-polarized scattering coefficients contain single scattering terms and multiple scattering terms. The single scattering terms are shown to reduce to the first-order solutions derived from the small perturbation method when the roughness parameters satisfy the slightly rough conditions. When surface roughnesses are large but the surface slope is small, only a single scattering term corresponding to the standard Kirchhoff model is significant. If the surface slope is large, the multiple scattering term will also be significant. The cross-polarized backscattering coefficients satisfy reciprocity and contain only multiple scattering terms. The difference between vertical and horizontal scattering coefficients increases with the dielectric constant and is generally smaller than that predicted by the first-order small perturbation model. Good agreements are obtained between this model and measurements from statistically known surfaces
  • Keywords
    backscatter; electromagnetic wave scattering; EM waves; backscattering model; dielectric constant; multiple scattering; randomly rough dielectric surface; reciprocity; roughness parameters; scattering coefficients; single scattering; small perturbation method; surface slope; Backscatter; Dielectrics; Electromagnetic scattering; Integral equations; Magnetic fields; Perturbation methods; Polarization; Rough surfaces; Scattering parameters; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.134085
  • Filename
    134085