• DocumentCode
    1127391
  • Title

    Charged particle effects on optoelectronic devices and bit error rate measurements on 400 Mbps fiber based data links

  • Author

    Marshall, Peter ; Dale, Cheryl ; LaBel, Ken

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    41
  • Issue
    3
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    528
  • Lastpage
    533
  • Abstract
    Proton test results on a fiber optic data link operating at 400 megabits/s (Mbps) are described to elucidate the roles of important variables such as proton angle of entry and the optical signal strength. Interpretation of these data reveals that direct ionization events from protons can result in bit errors, though these effects can be mitigated with increased optical signal strength. We explore the consequences of these results to suggest single event tolerant approaches for satellite applications, and conclude that radiation tolerant links and busses can operate in even the most severe orbital environments with acceptable error rates of <10-9
  • Keywords
    error statistics; optical fibres; optical links; optoelectronic devices; proton effects; satellite relay systems; 400 Mbit/s; bit error rate measurements; busses; charged particle effects; direct ionization events; fiber based data links; fiber optic data link; optical signal strength; optoelectronic devices; orbital environments; proton angle of entry; proton test results; radiation tolerant links; satellite applications; single event tolerant approaches; Bit error rate; Current measurement; Extraterrestrial measurements; Optical fiber devices; Optical fiber testing; Optical fibers; Optoelectronic devices; Particle measurements; Protons; Satellites;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.299794
  • Filename
    299794