DocumentCode
1127493
Title
Discrimination Between Log-Normal and Weibull Clutter
Author
Szajnowski, W.J.
Author_Institution
Warsaw Technical University
Issue
5
fYear
1977
Firstpage
480
Lastpage
485
Abstract
Two simple tests are presented for classifying a set of clutter samples into either the log-normal or Weibull distribution. The results obtained by Monte Carlo simulation have shown that both of these tests are only slightly inferior to the test based on the ratio of maximized likelihoods. An application to constant false-alarm rate (CFAR) processing is also discussed.
Keywords
Clutter; Detectors; Hardware; Parameter estimation; Pattern recognition; Radar detection; Shape; Statistical distributions; Testing; Weibull distribution;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/TAES.1977.308413
Filename
4101859
Link To Document