DocumentCode
1127835
Title
In situ characterization of laser diodes from wide-band electrical noise measurements
Author
Andrekson, P.A. ; Andersson, P. ; Alping, A. ; Eng, S.T.
Author_Institution
Chalmers University of Technology, Gothenburg, Sweden
Volume
4
Issue
7
fYear
1986
fDate
7/1/1986 12:00:00 AM
Firstpage
804
Lastpage
812
Abstract
The wide-band electrical noise characteristics of 0.8-, 1.3-, and 1.5-μm laser diodes have been studied theoretically and for the first time also experimentally. The electrical noise is related to the optical intensity noise behavior, and can therefore be used for in situ measurements and characterization of laser diodes. Since the measurements are performed without any optical components, undesired optical feedback is eliminated. The results show that several important laser parameters and characteristics can be extracted from purely electrical noise measurements. Among these are the relaxation frequency, the threshold current, the emission linewidth, optical feedback properties, and longitudinal mode hopping behavior. Good agreement between the noise theory and the electrical noise measurements has been obtained. An expression for obtaining both the spectral linewidth and lineshape from electrical noise measurements is also derived.
Keywords
Laser measurements; Laser noise; Measurement noise; Noise measurement; Semiconductor lasers; Diode lasers; Electric variables measurement; Laser feedback; Laser modes; Noise measurement; Optical devices; Optical feedback; Optical noise; Performance evaluation; Wideband;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.1986.1074803
Filename
1074803
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