DocumentCode :
1128281
Title :
Long-term reliability of layer-type tight structure cable
Author :
Tanaka, Shigeru ; Kameo, Yuji ; Tsuneishi, Katsuyuki
Author_Institution :
Sumitomo Electric Industries, Ltd., Totsuka-ku, Yokohama, Japan
Volume :
4
Issue :
8
fYear :
1986
fDate :
8/1/1986 12:00:00 AM
Firstpage :
1183
Lastpage :
1188
Abstract :
The long-term reliability of the optical-fiber strength in the tight structure cable is discussed from the viewpoint of residual fiber strain and prooftesting condition. The maximum fiber strain in the installed tight structure cable was evaluated as 0.05 percent experimentally as the summation of: 1) compressive strain induced by nylon jacketing; 2) added strain during cable; 3) residual strain by cable installation; and 4) thermal strain in the installed condition. Based on these measured residual strains on the typical 12-fiber cable with silicone resin and nylon-coated fiber, the required prooftest level was found to be 0.19 percent in order to guarantee the 10 000-km fiber for 25 years with failure probability less than 10-3.
Keywords :
Communication system reliability; Optical fiber cables; Optical fiber mechanical factors; Strain; Acceleration; Cable shielding; Capacitive sensors; Estimation theory; Fatigue; Life estimation; Optical fiber cables; Optical fibers; Resins; Strain measurement;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.1986.1074855
Filename :
1074855
Link To Document :
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