• DocumentCode
    1128281
  • Title

    Long-term reliability of layer-type tight structure cable

  • Author

    Tanaka, Shigeru ; Kameo, Yuji ; Tsuneishi, Katsuyuki

  • Author_Institution
    Sumitomo Electric Industries, Ltd., Totsuka-ku, Yokohama, Japan
  • Volume
    4
  • Issue
    8
  • fYear
    1986
  • fDate
    8/1/1986 12:00:00 AM
  • Firstpage
    1183
  • Lastpage
    1188
  • Abstract
    The long-term reliability of the optical-fiber strength in the tight structure cable is discussed from the viewpoint of residual fiber strain and prooftesting condition. The maximum fiber strain in the installed tight structure cable was evaluated as 0.05 percent experimentally as the summation of: 1) compressive strain induced by nylon jacketing; 2) added strain during cable; 3) residual strain by cable installation; and 4) thermal strain in the installed condition. Based on these measured residual strains on the typical 12-fiber cable with silicone resin and nylon-coated fiber, the required prooftest level was found to be 0.19 percent in order to guarantee the 10 000-km fiber for 25 years with failure probability less than 10-3.
  • Keywords
    Communication system reliability; Optical fiber cables; Optical fiber mechanical factors; Strain; Acceleration; Cable shielding; Capacitive sensors; Estimation theory; Fatigue; Life estimation; Optical fiber cables; Optical fibers; Resins; Strain measurement;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.1986.1074855
  • Filename
    1074855