DocumentCode
1128281
Title
Long-term reliability of layer-type tight structure cable
Author
Tanaka, Shigeru ; Kameo, Yuji ; Tsuneishi, Katsuyuki
Author_Institution
Sumitomo Electric Industries, Ltd., Totsuka-ku, Yokohama, Japan
Volume
4
Issue
8
fYear
1986
fDate
8/1/1986 12:00:00 AM
Firstpage
1183
Lastpage
1188
Abstract
The long-term reliability of the optical-fiber strength in the tight structure cable is discussed from the viewpoint of residual fiber strain and prooftesting condition. The maximum fiber strain in the installed tight structure cable was evaluated as 0.05 percent experimentally as the summation of: 1) compressive strain induced by nylon jacketing; 2) added strain during cable; 3) residual strain by cable installation; and 4) thermal strain in the installed condition. Based on these measured residual strains on the typical 12-fiber cable with silicone resin and nylon-coated fiber, the required prooftest level was found to be 0.19 percent in order to guarantee the 10 000-km fiber for 25 years with failure probability less than 10-3.
Keywords
Communication system reliability; Optical fiber cables; Optical fiber mechanical factors; Strain; Acceleration; Cable shielding; Capacitive sensors; Estimation theory; Fatigue; Life estimation; Optical fiber cables; Optical fibers; Resins; Strain measurement;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.1986.1074855
Filename
1074855
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