• DocumentCode
    1128590
  • Title

    The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles

  • Author

    Hong, Yili ; Meeker, William Q. ; Escobar, Luis A.

  • Author_Institution
    Dept. of Stat., Iowa State Univ., Ames, IA
  • Volume
    57
  • Issue
    2
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    260
  • Lastpage
    266
  • Abstract
    The failure probability of a product F(t), and the life time quantile t p are commonly used metrics in reliability applications. Confidence intervals are used to quantify the s-uncertainty of estimators of these two metrics. In practice, a set of pointwise confidence intervals for F(t), or the quantiles t p are often plotted on one graph, which we refer to as pointwise ldquoconfidence bands.rdquo These confidence bands for F(t) or t p can be obtained through s-normal approximation, maximum likelihood, or other procedures. In this paper, we compare s-normal approximation to likelihood methods, and introduce a new procedure to get the confidence intervals for F(t) by inverting the pointwise confidence bands of the quantile t p function. We show why it is valid to interpret the set of pointwise confidence intervals for the quantile function as a set of pointwise confidence intervals for F(t), and vice-versa. Our results also indicate that the likelihood-based pointwise confidence bands have desirable statistical properties, beyond those that were known previously.
  • Keywords
    approximation theory; maximum likelihood estimation; reliability theory; failure probabilities; life time quantiles; maximum likelihood methods; pointwise confidence bands; pointwise confidence intervals; reliability applications; s-normal approximation; statistical properties; $s$-normal approximation; Asymptotic approximation; confidence bands; life data analysis; likelihood confidence interval; maximum likelihood;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2008.920352
  • Filename
    4488172