• DocumentCode
    1128601
  • Title

    Polarization-resolved low-frequency noise in GaAlAs lasers

  • Author

    Dandridge, Anthony ; Miles, Ronald O. ; Taylor, Henry F.

  • Author_Institution
    Naval Research Laboratory, Washington, DC, USA
  • Volume
    4
  • Issue
    9
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    1311
  • Lastpage
    1316
  • Abstract
    Low-frequency intensity noise displaying 1/ f dependency of the light polarized parallel and perpendicular to the junction plane and the correlation between these noise components is investigated in GaAlAs diode lasers. The absolute noise level for the component polarized parallel to the junction (lasing component) rises about 40 dB as the current passes through lasing threshold, while the noise for the orthogonal polarization drops by about 5 dB. The two noise components are well correlated slightly below threshold (coherence function ∼ 0.9), but the coherence function drops rapidly to near zero above threshold. An exception to this behavior occurs in the lasing mode when mode hopping takes place, when the two noise components are well correlated. A qualitative explanation for these phenomena is based on the relation between spontaneous and stimulated emission rates and fluctuations in the intracavity carrier density.
  • Keywords
    Gallium materials/lasers; Laser noise; Optical polarization; Diode lasers; Laser modes; Laser noise; Low-frequency noise; Noise level; Noise measurement; Optical fiber polarization; Optical polarization; Semiconductor device noise; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.1986.1074890
  • Filename
    1074890