DocumentCode
1128601
Title
Polarization-resolved low-frequency noise in GaAlAs lasers
Author
Dandridge, Anthony ; Miles, Ronald O. ; Taylor, Henry F.
Author_Institution
Naval Research Laboratory, Washington, DC, USA
Volume
4
Issue
9
fYear
1986
fDate
9/1/1986 12:00:00 AM
Firstpage
1311
Lastpage
1316
Abstract
Low-frequency intensity noise displaying 1/
dependency of the light polarized parallel and perpendicular to the junction plane and the correlation between these noise components is investigated in GaAlAs diode lasers. The absolute noise level for the component polarized parallel to the junction (lasing component) rises about 40 dB as the current passes through lasing threshold, while the noise for the orthogonal polarization drops by about 5 dB. The two noise components are well correlated slightly below threshold (coherence function ∼ 0.9), but the coherence function drops rapidly to near zero above threshold. An exception to this behavior occurs in the lasing mode when mode hopping takes place, when the two noise components are well correlated. A qualitative explanation for these phenomena is based on the relation between spontaneous and stimulated emission rates and fluctuations in the intracavity carrier density.
dependency of the light polarized parallel and perpendicular to the junction plane and the correlation between these noise components is investigated in GaAlAs diode lasers. The absolute noise level for the component polarized parallel to the junction (lasing component) rises about 40 dB as the current passes through lasing threshold, while the noise for the orthogonal polarization drops by about 5 dB. The two noise components are well correlated slightly below threshold (coherence function ∼ 0.9), but the coherence function drops rapidly to near zero above threshold. An exception to this behavior occurs in the lasing mode when mode hopping takes place, when the two noise components are well correlated. A qualitative explanation for these phenomena is based on the relation between spontaneous and stimulated emission rates and fluctuations in the intracavity carrier density.Keywords
Gallium materials/lasers; Laser noise; Optical polarization; Diode lasers; Laser modes; Laser noise; Low-frequency noise; Noise level; Noise measurement; Optical fiber polarization; Optical polarization; Semiconductor device noise; Semiconductor lasers;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.1986.1074890
Filename
1074890
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