DocumentCode :
1128655
Title :
The breakdown mechanism of poly-p-xylylene film. Prestress effects on the breakdown strength
Author :
Mori, Tatsuo ; Matsuoka, Toshiki ; Mizutani, Teruyoshi
Author_Institution :
Dept. of Electr. Eng., Nagoya Univ., Japan
Volume :
1
Issue :
1
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
71
Lastpage :
76
Abstract :
Impulse and dc breakdown strengths of 4 μm thick poly-p-xylylene (PPX) films were 5.9 and 4.1 MV/cm, respectively. They were independent of temperature in the temperature range from -60 to 60°C. dc prestressing for a long time (tp=60 s) reduced impulse breakdown strength for both the same and the opposite polarity. But dc prestressing for a short time (tp<1 s) increased impulse breakdown strength for the same polarity. These results were explained by positive space charge in PPX film. It was also concluded that positive charge carrier injected from the anode, spread in a 4 μm thick PPX film during a short time
Keywords :
electric breakdown of solids; impact ionisation; impulse testing; insulation testing; organic insulating materials; polymer films; -60 to 60 C; 4 mum; DC breakdown strength; DC prestressing; breakdown mechanism; electronic avalanche breakdown; impulse breakdown strength; polarity dependence; poly-p-xylylene film; positive charge carrier injection; positive space charge; Avalanche breakdown; Breakdown voltage; Conducting materials; Dielectric thin films; Electric breakdown; Electrodes; Plastic insulation; Polymers; Space charge; Transistors;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.300233
Filename :
300233
Link To Document :
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