DocumentCode :
1128746
Title :
The significance of the Weibull threshold in short-term breakdown statistics
Author :
Laurent, C. ; Chauvet, C. ; Berdala, J.
Author_Institution :
Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
Volume :
1
Issue :
1
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
160
Lastpage :
162
Abstract :
Routine breakdown tests performed on large populations of laboratory-aged polyethylene insulated power cable slices and slices taken from aged cables are analysed according to a Weibull model. The unaged reference populations are described by a three-parameter distribution, i.e. with a nonzero location parameter or threshold. On the contrary, the aged populations may be fitted by a simple two-parameter model. A tentative interpretation stating a threshold dependence on aging is proposed on the basis of previous results
Keywords :
ageing; cable insulation; electric breakdown of solids; organic insulating materials; power cables; Weibull threshold; aged cables; laboratory-aged polyethylene insulated power cable; nonzero location parameter; short-term breakdown statistic; three-parameter distribution; threshold dependence; two-parameter model; unaged reference populations; Aging; Breakdown voltage; Cables; Electric breakdown; Electrodes; Laboratories; Performance evaluation; Polyethylene; Statistics; System testing;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.300244
Filename :
300244
Link To Document :
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