• DocumentCode
    1128746
  • Title

    The significance of the Weibull threshold in short-term breakdown statistics

  • Author

    Laurent, C. ; Chauvet, C. ; Berdala, J.

  • Author_Institution
    Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
  • Volume
    1
  • Issue
    1
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    160
  • Lastpage
    162
  • Abstract
    Routine breakdown tests performed on large populations of laboratory-aged polyethylene insulated power cable slices and slices taken from aged cables are analysed according to a Weibull model. The unaged reference populations are described by a three-parameter distribution, i.e. with a nonzero location parameter or threshold. On the contrary, the aged populations may be fitted by a simple two-parameter model. A tentative interpretation stating a threshold dependence on aging is proposed on the basis of previous results
  • Keywords
    ageing; cable insulation; electric breakdown of solids; organic insulating materials; power cables; Weibull threshold; aged cables; laboratory-aged polyethylene insulated power cable; nonzero location parameter; short-term breakdown statistic; three-parameter distribution; threshold dependence; two-parameter model; unaged reference populations; Aging; Breakdown voltage; Cables; Electric breakdown; Electrodes; Laboratories; Performance evaluation; Polyethylene; Statistics; System testing;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.300244
  • Filename
    300244