DocumentCode
1128756
Title
Weibull statistics in short-term dielectric breakdown of thin polyethylene films [comment and reply]
Author
Donazzi, F. ; Luoni, G. ; Laurent, C.
Volume
1
Issue
1
fYear
1994
fDate
2/1/1994 12:00:00 AM
Firstpage
163
Abstract
For original paper see ibid., vol.28, p18-29 (1993).The comments make it clear and underline that a parameter obtained from ramped voltages bears no relationship whatsoever with the life threshold parameter that would be derived from constant stress experiments. A reply is given
Keywords
electric breakdown of solids; insulation testing; life testing; organic insulating materials; polymer films; Weibull statistics; constant stress experiments; life threshold parameter; ramped voltages; short-term dielectric breakdown; thin polyethylene films; Breakdown voltage; Dielectric breakdown; Dielectric thin films; Electric breakdown; Electrodes; Plastic films; Polyethylene; Statistics; Stress; Testing;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/94.300245
Filename
300245
Link To Document