Title :
Fast EM/Circuit Transient Simulation Using Laguerre Equivalent Circuit (SLeEC)
Author :
Srinivasan, Krishna ; Yadav, Pradeep ; Engin, A. Ege ; Swaminathan, Madhavan ; Ha, Myunghyun
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Transient electromagnetic (EM)/circuit simulation using Laguerre polynomials is an unconditionally stable scheme. Prior work done on this topic, called Laguerre finite-difference time domain (FDTD), has the limitation of being able to simulate only for a certain time duration. An equivalent circuit model of the FDTD grid allows easier implementation of the algorithm, avoiding long cumbersome equations, and enabling the use of modified nodal analysis for transient EM simulation using Laguerre polynomials. The enhanced method has been called SLeEC, and stands for simulation using Laguerre equivalent circuit. In this paper, a memory and time-efficient solution has been proposed to overcome this limitation, so that transient simulation can be done for all time duration. SLeEC has been applied to solve linear transient circuit simulation problems. Equivalent companion models for inductors, mutual inductance, and capacitors have been derived.
Keywords :
circuit simulation; computational electromagnetics; equivalent circuits; finite difference time-domain analysis; polynomials; Laguerre equivalent circuit; Laguerre finite-difference time domain; Laguerre polynomials; circuit transient simulation; equivalent circuit model; fast EM simulation; linear transient circuit simulation; memory solution; nodal analysis; time-efficient solution; transient EM simulation; transient electromagnetic simulation; Algorithm design and analysis; Analytical models; Circuit simulation; Electromagnetic transients; Equations; Equivalent circuits; Finite difference methods; Polynomials; Time domain analysis; Transient analysis; Finite-difference time domain (FDTD); Laguerre polynomials; modified nodal analysis;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2009.2024158