Title :
Automatic Yarn Characterization System: Design of a Prototype
Author :
Carvalho, Vítor H. ; Belsley, Michael S. ; Vasconcelos, Rosa M. ; Soares, Filomena O.
Author_Institution :
Dept. of Ind. Electron., Minho Univ., Guimaraes, Portugal
Abstract :
This paper presents Yarn System Quality (YSQ), an innovative, low-cost, portable and high-precision yarn evaluation tester, for quality control of yarn characteristics under laboratory conditions. It presents a modular architecture, simultaneously integrating measurements of yarn hairiness, mass, regularity and diameter. An external module to obtain the yarn production characteristics using analogue optics and image processing is also available. The quantification of yarn hairiness and diameter variation (with a sampling resolution length of 1 mm) is carried out using photodiodes; the diameter characterization, based on 0.5 mm width samples, employs a linear photodiode array; the measurements of mass variation, based on samples of 1 mm, uses a parallel plate capacitive sensor. In the YSQ measurement parameters based on optical sensors a coherent signal processing technique with Fourier analysis is used, to obtain linear output signal variations. A comparison between the results obtained using the YSQ tester and a commercial solution is also presented.
Keywords :
automatic optical inspection; capacitive sensors; optical sensors; photodiodes; production engineering computing; quality control; yarn; Fourier analysis; analogue optics; automatic yarn characterization system; diameter characterization; image processing; linear photodiode array; optical sensors; parallel plate capacitive sensor; signal processing technique; yarn diameter; yarn evaluation tester; yarn hairiness; yarn mass; yarn production characteristics; yarn quality control; yarn system quality; Laboratories; Optical sensors; Optical signal processing; Photodiodes; Production; Prototypes; Quality control; Sensor arrays; System testing; Yarn; Capacitive sensors; optical sensors; signal processing; yarn parameterization;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2009.2025810