• DocumentCode
    1128884
  • Title

    SOI Pixel Based on a Floating Body Partially Depleted MOSFET in a Delta-Sigma Loop

  • Author

    Harik, Louis ; Sallese, Jean-Michel ; Kayal, Maher

  • Author_Institution
    Dept. of Electr. Eng., Ecole Polytech. Federate de Lausanne, Lausanne, Switzerland
  • Volume
    9
  • Issue
    8
  • fYear
    2009
  • Firstpage
    994
  • Lastpage
    1001
  • Abstract
    Standard techniques used for measuring the photocurrent of an SOI phototransistor have failed due to two main reasons: the first being the low signal-to-noise ratio and the second being the slow transient. In this paper, the partially depleted silicon on insulator (SOI) metal-oxide-semiconductor field effect transistor (MOSFET) has been used as a light intensity sensor. Using a novel technique of measurement enables us to embed this phototransistor in the delta-sigma loop. The presented circuits implement a first-order delta-sigma modulator with limited number of transistors maximizing the fill factor. Measured data show that the implemented pixels were sensitive to flux densities as low as 3 mW/m2 with a resolution of 7.5 bits.
  • Keywords
    MOSFET; delta-sigma modulation; photodetectors; phototransistors; silicon-on-insulator; SOI pixel; first-order delta-sigma modulator; floating body partially depleted MOSFET; light intensity sensor; metal-oxide-semiconductor field effect transistor; phototransistor; silicon on insulator; Delta modulation; Density measurement; FETs; MOSFET circuits; Measurement standards; Metal-insulator structures; Photoconductivity; Phototransistors; Signal to noise ratio; Silicon on insulator technology; Partially depleted; phototransistors; silicon on insulator (SOI) metal-oxide-semiconductor field effect transistor (MOSFET); transient charge pumping;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2009.2025807
  • Filename
    5159538