• DocumentCode
    1128951
  • Title

    BIST the hard way

  • Author

    Davidson, S.

  • Author_Institution
    Sun Microsystems
  • Volume
    22
  • Issue
    4
  • fYear
    2005
  • Firstpage
    386
  • Lastpage
    387
  • Abstract
    Reviewed in this issue A Designer´s Guide to Built-in Self-Test, by Charles E. Stroud (Springer, 2002, ISBN 1-402-07050-0, 344 pp., $125).
  • Keywords
    IC; N-detection; built-in self-test; logic; mixed-signal BIST; scan BIST; Automatic testing; Books; Built-in self-test; Computer Society; Engines; Firewire; Logic testing; Programmable logic arrays; Sun; System testing; IC; N-detection; built-in self-test; logic; mixed-signal BIST; scan BIST;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2005.79
  • Filename
    1492298
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1128951