Abstract :
Most readers of IEEE Design & Test are IC people. We IC people have been running scared our entire careers. On the test side, at least, we´ve been sure that the next process node, the next tenfold increase in gate and transistor count, will break our tools and create a set of defects that we don´t know how to test. Disaster is always just around the corner. We hope that new techniques, like IDDQ and N-detect test, will save us from the scary new defects.
