• DocumentCode
    1129104
  • Title

    2D test sequence generators

  • Author

    Mrugalski, Grzegorz ; Tyszer, Jerzy ; Rajski, Janusz

  • Author_Institution
    Poznan Univ. of Technol., Poland
  • Volume
    20
  • Issue
    1
  • fYear
    2003
  • Firstpage
    51
  • Lastpage
    59
  • Abstract
    In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and balances the use of generator stages.
  • Keywords
    VLSI; automatic test pattern generation; built-in self test; phase shifters; shift registers; 2D stimuli; 2D test sequence generators; LFSRs; algorithm; generator stages; hit ratios; linear dependencies; phase shifters; Circuit testing; Electrical fault detection; Equations; Galois fields; Graphics; Linear feedback shift registers; Phase shifters; Polynomials; Test pattern generators; Vectors;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1173053
  • Filename
    1173053
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1129104