Title :
2D test sequence generators
Author :
Mrugalski, Grzegorz ; Tyszer, Jerzy ; Rajski, Janusz
Author_Institution :
Poznan Univ. of Technol., Poland
Abstract :
In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and balances the use of generator stages.
Keywords :
VLSI; automatic test pattern generation; built-in self test; phase shifters; shift registers; 2D stimuli; 2D test sequence generators; LFSRs; algorithm; generator stages; hit ratios; linear dependencies; phase shifters; Circuit testing; Electrical fault detection; Equations; Galois fields; Graphics; Linear feedback shift registers; Phase shifters; Polynomials; Test pattern generators; Vectors;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1173053
