• DocumentCode
    1129133
  • Title

    Error tolerance

  • Author

    Kahng, Andrew B.

  • Author_Institution
    University of California, San Diego
  • Volume
    20
  • Issue
    1
  • fYear
    2003
  • Firstpage
    86
  • Lastpage
    87
  • Keywords
    Alpha particles; Circuit noise; Circuit testing; Computer errors; Error correction; Fault tolerant systems; Integrated circuit interconnections; Logic testing; Noise level; Silicon on insulator technology;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1173057
  • Filename
    1173057
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1129133